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Impedance Measurement (R,L,C,Q,D) > RLC Bridges / Meters > 4155B Semicondudtor Parametric Analyzer by Hewlett Packard - Agilent- Keysight

4155B Semicondudtor Parametric Analyzer

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Product Description & Specs

Description HP 4155B Semiconductor Parameter Analyzer Description
The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display.


High-resolution/accuracy and wide range.
1 fA to 1 A; 1?V to 200 V
Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
Synchronized stress/measure function, two high-voltage pulse generator units (?40 V)
Time-domain measurement: 60?s-variable intervals, up to 10,001 points
Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
Built-in HP Instrument BASIC, trigger I/O capability

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