Contact Us
Product Categories:
About Kandel Electronics
Visa | Master Card | Amex

SALE #1 — March 16-20
SALE #2 — March 21-26

Kandel Electronics is preparing for retirement
after serving our industry for 25 YEARS.
We are grateful for your support!

Click Here for More Information!
Product Search:  

Impedance Measurement (R,L,C,Q,D) > RLC Bridges / Meters > 590 C-V Analyzer 100KHz or 1MHz by Keithley

590 C-V Analyzer 100KHz or 1MHz

 Request a Quote

Product Description & Specs

The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.

High frequency (100kHz or 1MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.

*0.1fF sensitivity to test small devices.
*Ranges up to 20nF (at 100kHz, using 5904 adapter) to test large, leaky, or forward biased devices.
*Test signal voltage of 15mV rms.
*Choice of 1MHz frequency for compliance with existing test standards or 100kHz for improved resolution, range, and ccuracy.
*Selectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-offs.
*Sophisticated correction for transmission line errors due to device connections.
*Built-in test setup and correction value storage, analysis, and plotter control to minimize computer programming.

E-mail or call us at 800-582-8378 for more information.

Home   About   Contact   Category   Manufacturer   Search   Equipment Rentals   Weekly Specials

Copyright © 1998-2014, Kandel Electronics, Inc.