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Impedance Measurement (R,L,C,Q,D) > RLC Bridges / Meters > 590 C-V Analyzer 100KHz or 1MHz by Keithley
590 C-V Analyzer 100KHz or 1MHz
Product Description & Specs
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100kHz or 1MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
*0.1fF sensitivity to test small devices.
*Ranges up to 20nF (at 100kHz, using 5904 adapter) to test large, leaky, or forward biased devices.
*Test signal voltage of 15mV rms.
*Choice of 1MHz frequency for compliance with existing test standards or 100kHz for improved resolution, range, and ccuracy.
*Selectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-offs.
*Sophisticated correction for transmission line errors due to device connections.
*Built-in test setup and correction value storage, analysis, and plotter control to minimize computer programming.
E-mail or call us at 800-582-8378 for more information.